1. F. Z. Amir, W. Donner, M. Aspelmeyer, B. Noheda4, X. X.
Xi, and S. C. Moss, Phys. Status Solidi A, 1–5, August
2012, Strain Profile and Polarization Enhancement in Ba0.5Sr0.5TiO3
Thin films.
2. F.Z. Amir, K. Clark, E. Maldonado, J. Jiang, J.W. Ager III,
K.M. Yu, W. Walukiewicz, W. P. Kirk, J. Crys. Growth 310, January
2008, Epitaxial Growth of Cd1-xSexTe Thin Films on Si (100) by
Molecular Beam Epitaxy Using Lattice Mismatch Graded
Structures.
3. R. J. Cottier, F. Z. Amir, W. Zhao, K. Hossain, B. P. Gorman,
T. D. Golding, N. Anibou, and W. Donner, J. Vac.
Sci. Technol. B 24 (3), June 2006, Molecular Beam Epitaxial Growth
of Osmium Silicides.
4. F.Z. Amir, R.J. Cottier, T. D. Golding, W. Donner, N. Anibou
and D. Stokes, J. Crys. Growth 294, July 2006, X-ray Diffraction
Analysis on an Osmium Silicide Epilayer Grown on Si (100) by
Molecular Beam Epitaxy.
5. R. J. Cottier, F.Z. Amir, K. Hossein, L.J. Mitchell, J.B.
House, B.P. Gorman, O.W. Holland, T.D. Golding. J. Vac. Sci.
Technol. B 23 (3), May/June 2005, Molecular Beam Epitaxial Growth
of Fe(SiGe)2 Epilayers.